Short Courses and Conferences

2014 IEEE Conference on Reliability Science for Advanced Materials and Devices

Institute of Electrical and Electronics Engineers

September 7 - 9, 2014

Technical Program

Venue: Unless noted otherwise, all events take place in Petroleum Hall, Green Center, Mines Campus
http://www.csmspace.com/events/rsamd/venue.html

Day 1  Day 2  Day 3

Day 1 • Sunday, September 7, 2014

9:00 amRegistration
Green Center Lobby
10:30Opening Remarks
Carole Graas, IBM, Essex Junction, VT
KN
10:45
Keynote
Packaging and Assembly Reliability for Harsh Environments
Wayne Johnson, Tennessee Tech University
F-1
11:45
Featured#1
IEEE Future Directions
William R. Tonti, Director of IEEE Future Directions
F-2
12:30 pm
Featured#2
Case Study for Using Emerging Neural Networks Algorithms to Solve Real Problems in Microelectronic Processing
Charles Ellis, Auburn University
RT
1:15
Roundtable Discussion
Host: Carole Graas, IBM, Essex Junction, VT
1:45Break

Session 1: Wide-Bandgap Semiconductors

WBG
2:00
Session Introduction : Wide-Bandgap Semiconductors
Robert Kaplar, Sandia National Laboratory, Albuquerque, NM
WBG-L
2:05
Lecture
Recent Progress in Understanding the Electrical Reliability of GaN High-Electron Mobility Transistors
Jesús A. del Alamo, Massachusetts Institute of Technology
WBG-O1
3:05
Oral#1
One Year Reliability Validation of GaN Power Semiconductors in Low-Voltage Power Electronic Applications
Luke L. Jenkins et al., Auburn University
3:25Break and Posters Setup

Poster Session

4:00Poster Session
Venue: Geology Museum, Mines Campus
http://www.mines.edu/Geology_Museum
6:00Adjourn

Back to top

Day 2 • Monday, September 8, 2014

Session 2: Degradation Mechanisms in Use Environment

DM
8:00 am
Session Introduction : Degradation Mechanisms in Use Environment
Patrick McCluskey, University of Maryland CALCE, College Park, MD
DM-L
8:05
Lecture
Reliability and Failure Mechanisms in Capacitors
Michael H. Azarian, University of Maryland
DM-I1
9:05
Invited#1
Reliability Challenges in Automotive Power
Douglas DeVoto, NREL
9:35Break
DM-I2
9:45
Invited#2
Reliability of GaN HEMTs: Electrical and Radiation-Induced Failure Mechanisms
Travis Anderson, Naval Research Lab
DM-I3
10:15
Invited#3
NanoSpring Bonding Reliability using Indium Solder
David Shaddock, GE
DM-O1
10:45
Oral#1
Design of a Test Vehicle for Evaluating ALD Coatings as Moisture Barrier Layers for Thermal Ground Planes
Ching-yi Lin et al., University of Colorado at Boulder
DM-O2
11:05
Oral#2
Proposed Method for Fatigue Testing of Structural Materials Using Micro-Scale Specimens
Li-Anne Liew et al., University of Colorado at Boulder
11:25Announcements
11:30Lunch

Session 3: Emerging Microelectronics

EME
1:00 pm
Session Introduction: Emerging Microelectronics
Prakash Periasamy, IBM, Essex Junction, VT
Michael Hamilton, Auburn University, Auburn, AL
EME-L
1:05
Lecture
Transformational Electronics: Flexible, Stretchable, Transparent Inorganic Nanoelectronics
Prof. Muhammad Mustafa Hussain, KAUST
EME-I1
2:05
Invited#1
Through Silicon Via Interconnect Reliability Aspects for 3DIC Integration
C.S. Premachandran, Global Foundries, Malta, NY
EME-O1
2:35
Oral#1
Reliability of Conformal Electronics in Curvilinear Environments: Device First vs. Device Last Approach
Muhammad Mustafa Hussain et al., KAUST
EME-O2
2:55
Oral#2
The Impact of Material Properties on the Reliability of LED Lighting Systems
Lynn Davis et al., RTI International
3:15Break

Session 4: Pb-Free Electronics Reliability

PFE
3:45
Session Introduction: Pb-Free Electronics Reliability
Robert Dean, Auburn University, Auburn, AL
PFE-L
3:50
Lecture
Reliability of Pb-Free Electronics
Michael Osterman, University of Maryland
PFE-O1
4:50
Oral#1
The Study of Mechanical Testing on various Doped Low Creep Lead Free Solder Paste and Solder Ball Grid Array Packages
Sivasubramanian Thirugnanasambandam et al., Auburn University
5:10Adjourn
5:15IEEE Reliability Society Presentation
Jason Rupe, Managing Editor, IEEE Transactions on Reliability

Back to top

Day 3 • Tuesday, September 9, 2014

Session 5: Photovoltaics and Renewables

PVR
8:00 am
Session Introduction: Photovoltaics and Renewables
Shubhra Bansal, U.S. Department of Energy, Washington, DC
Lenny Tinker, U.S. Department of Energy, Washington, DC
PVR-L
8:10
Lecture
Thermomechanical Reliability in PV Devices and Structures
Reinhold Dauskardt, Stanford University
PVR-I1
8:55
Invited#1
Predictive models of Li-ion battery reliability
Kandler Smith, NREL
9:25Break
PVR-I2
9:40
Invited#2
Metastabilities and Junction Degradation in CIGS
Kannan Ramanathan, NREL
PVR-I3
10:10
Invited#3
Towards Mature Accelerated Tests and Quantitative Predictions of Crystalline Si PV Reliability
Yu-Chen Shen, SunPower
PVR-I4
10:40
Invited#4
Degradation in CdTe Solar Cells
Marco Nardone, Bowling Green State University
PVR-O1
11:10
Oral#1
Lifetime and Degradation Science Approach Towards PV System Reliability
M. A. Hossain et al., Case Western Reserve University
11:30Awards Lunch
Host: Carole Graas, IBM, Essex Junction, VT
Robert Dean, Auburn University, Auburn, AL
Venue: Friedhoff Hall, Green Center, Mines Campus
1:00 pm - 6:00PV Workshop: DOE SunShot Workshop on Mechanistic Approaches to Degradation and Lifetime Predictions in Photovoltaics
Host: DOE
Venue: Petroleum Hall, Green Center, Mines Campus
1:00 pm - 3:00REMRSEC Lab Tour
http://remrsec.mines.edu/
Venue: Hill Hall, Mines Campus
6:30Conference Adjourn

Back to top


©2012 Colorado School of Mines  |  Copyright Information  |  Terms of Use  |  SPACE Home  |  Mines Home