Short Courses and Conferences
2014 IEEE Conference on Reliability Science for Advanced Materials and Devices
Institute of Electrical and Electronics Engineers
September 7 - 9, 2014
Technical Program Chair: Robert Dean, Auburn University, Auburn, AL Email : email@example.com
Call for Papers
Papers are being solicited for presentation at the Conference. Learn more...
Session 1. Degradation Mechanisms in Use Environments
Patrick McCluskey, University of Maryland CALCE, College Park, MD
This session seeks contributions discussing empirical observations or physics-based modeling of degradation mechanisms observed in advanced materials and devices in the environments in which they are used. Degradation mechanisms involving electrical, chemical, electro-chemical and mechanical processes observed or predicted as a function of the operating environment are appropriate topics for this session. Learn more...
Session 2. Photovoltaics and Renewables
Shubhra Bansal, U.S. Department of Energy, Washington, DC
Lenny Tinker, U.S. Department of Energy, Washington, DC
This session seeks contributions discussing current research into the reliability of photovoltaic and other renewable energy sources (wind power, bio-fuels, geothermal, etc.) and related systems (energy storage and batteries, power electronics, sensors, mechatronics, etc.). Topics such as failure mechanisms, environmental stressors, aging and asset health monitoring are of great interest. Learn more...
Session 3. Pb-Free Electronics Reliability
Robert Dean, Auburn University, Auburn, AL
This session seeks contributions discussing ongoing developments in the development of reliable Pb-free solders. Topics such as whiskering, embrittlement, aging, mixed-alloy stacks, and failure mechanisms are of great interest in this session. Submissions related to reliability issues in high-volume commercial process assembly are also of great interest. Learn more...
Session 4. Wide-Bandgap (WBG) Semiconductors
Robert Kaplar, Sandia National Laboratory, Albuquerque, NM
This section seeks contributions regarding cutting edge research in the reliability of WBG devices and systems. Examples include SiC, GaN and AlN devices, WBG power electronics, WBG RF devices and systems, and semiconductor lasers and other WBG photonic devices. Learn more...
Session 5. Emerging Electronics
Michael Hamilton, Auburn University, Auburn, AL
Prakash Periasamy, IBM, Essex Junction, VT
This section seeks contributions discussing fundamental new understandings of degradation and failure modes acquired through research for cutting-edge devices. Fields of interest are broad, including LEDs, mobile and bio-implantable electronics, TSVs for 3D, MEMS and nanotechnology. Learn more...
DOE SunShot Workshop on Mechanistic Approaches to Degradation and Lifetime Predictions in Photovoltaics
Attendance of the Workshop requires separate registration on a special website: