Short Courses and Conferences

2014 IEEE Conference on Reliability Science for Advanced Materials and Devices

Institute of Electrical and Electronics Engineers

September 7 - 9, 2014

Technical Program Chair: Robert Dean, Auburn University, Auburn, AL      Email :

Call for Papers

Papers are being solicited for presentation at the Conference. Learn more...

Conference Topics

Session 1.  Degradation Mechanisms in Use Environments

Patrick McCluskey, University of Maryland CALCE, College Park, MD

This session seeks contributions discussing empirical observations or physics-based modeling of degradation mechanisms observed in advanced materials and devices in the environments in which they are used.  Degradation mechanisms involving electrical, chemical, electro-chemical and mechanical processes observed or predicted as a function of the operating environment are appropriate topics for this session. Learn more...

Session 2. Photovoltaics and Renewables

Shubhra Bansal, U.S. Department of Energy, Washington, DC
Lenny Tinker, U.S. Department of Energy, Washington, DC

This session seeks contributions discussing current research into the reliability of photovoltaic and other renewable energy sources (wind power, bio-fuels, geothermal, etc.) and related systems (energy storage and batteries, power electronics, sensors, mechatronics, etc.).  Topics such as failure mechanisms, environmental stressors, aging and asset health monitoring are of great interest. Learn more...

Session 3. Pb-Free Electronics Reliability

Robert Dean, Auburn University, Auburn, AL

This session seeks contributions discussing ongoing developments in the development of reliable Pb-free solders. Topics such as whiskering, embrittlement, aging, mixed-alloy stacks, and failure mechanisms are of great interest in this session.  Submissions related to reliability issues in high-volume commercial process assembly are also of great interest. Learn more...

Session 4. Wide-Bandgap (WBG) Semiconductors

Robert Kaplar, Sandia National Laboratory, Albuquerque, NM

This section seeks contributions regarding cutting edge research in the reliability of WBG devices and systems. Examples include SiC, GaN and AlN devices, WBG power electronics, WBG RF devices and systems, and semiconductor lasers and other WBG photonic devices. Learn more...

Session 5. Emerging Electronics

Michael Hamilton, Auburn University, Auburn, AL
Prakash Periasamy, IBM, Essex Junction, VT

This section seeks contributions discussing fundamental new understandings of degradation and failure modes acquired through research for cutting-edge devices.  Fields of interest are broad, including LEDs, mobile and bio-implantable electronics, TSVs for 3D, MEMS and nanotechnology. Learn more...


DOE SunShot Workshop on Mechanistic Approaches to Degradation and Lifetime Predictions in Photovoltaics

Attendance of the Workshop requires separate registration on a special website:

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